Risk methodologies for technological legacies

Author：edited by Dennis C. Bley, James G. Droppo, and Vitaly A. Eremenko.
Publisher：Kluwer Academic Publishers
ISBN：1402012578 (alk. paper)
Publication Date：c2003.
其他作者：Bley, Dennis C. ; Droppo, J. G. ; Eremenko, V. A.
語言：zh
出版地：Dordrecht ; Boston :
Description

xxvii, 366 p. ::ill., maps ;:25 cm.

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