Atomic force microscopy in process engineering : introduction to AFM for improved processes and products

Author：[edited by] W. Richard Bowen and Nidal Hilal.
Publisher：Elsevier/Butterworth-Heinemann
ISBN：9780080949574 (electronic bk.) ; 0080949576 (electronic bk.)
Publication Date：2009
其他作者：Bowen, W. Richard. ; Hilal, Nidal.
版次：1st ed.
語言：zh
出版地：Oxford ; Burlington, MA :
Description

1 online resource (xvi, 283 p.) ::ill.

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