Charged semiconductor defects : structure, thermodynamics and diffusion

Author：by Edmund G. Seebauer, Meredith C. Kratzer.
Publisher：Springer London
ISBN：9781848820593 (electronic bk.) ; 9781848820586 (paper)
Publication Date：2009
其他作者：Seebauer, Edmund G. ; Kratzer, Meredith C.
語言：zh
出版地：London :
Description

xiv, 294 p. ::ill., digital ;:24 cm.

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