Characterization and behavior of interfaces : proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA

Author：edited by J. David Frost.
Publisher：IOS Press
ISBN：9781607504917 (electronic bk.) ; 9781607504900
Publication Date：c2010.
其他作者：Frost, J. David.
語言：zh
出版地：Amsterdam ; Fairfax, VA :
Description

x, 155 p. ::ill. ;:25 cm.

Search Same Author