VLSI test principles and architectures : design for testability

作者：edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
出版社：Elsevier Morgan Kaufmann Publishers
ISBN：9780123705976 ; 0123705975 ; 9780080474793 (electronic bk.) ; 0080474799 (electronic bk.) ; 6610966842 (electronic bk.) ; 9786610966844 (electronic bk.)
出版日期：c2006.
其他作者：Wang, Laung-Terng. ; Wu, Cheng-Wen ; Wen, Xiaoqing.
語言：zh
出版地：Amsterdam ; Boston :
內容簡介

1 online resource (xxx, 777 p.) ::ill.

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